Scanning Electron Microscopes (SEM)
SEMs with Tungsten, LaB6 or FE cathode - individually customized

Focused Ion Beam Microscopes
FIB-SEM / PFIB-SEM / Dual Column Systems with GIS, ToF-SIMS, SPM, Nano Manipulators and Analysis Systems

Analysis Systems
EDX, WDX, EBSD, 3D Surface Analysis,
Digital Image Processing and Analysis Systems

Preparation Systems
Sputter Coater, Carbon Coater, EB Carbon Coaters, Plasma Systems, Ion Mills, Polishing Systems, Decontamination Systems

Magnetic Field Cancelling Systems
for SEM, TEM FIB-SEM & Wafer-Inspection-Systems

Accessories and Spare Parts
from cathodes to sample holders and
noise prevention boxes

Some application areas for TESCAN Scanning Electron Microscopes,
W-SEM, LaB6-SEM, FE-SEM, UHR FE-SEM, FIB-SEM and PFIB-SEM

▪ Materials Science
▪ Quality Control
▪ Development
▪ Research
▪ Forensic Inv.
▪ Life Sciences
▪ Semiconductors

▪ Nanotechnology
▪ Lithography
▪ TEM Lamella
▪ TSV Analysis
▪ 3D Measurement
▪ 3D Tomography
▪ 3D Topography

▪ Achaeology
▪ Mineralogy
▪ Mining Industry
▪ Minerals Processing
▪ Enviromental Research
▪ Electr. Engineering


EO Elektronen-Optik-Service GmbH - Certified by TÜV Rheinland

The EO
Elektronen-Optik-Service GmbH has been SCC and ISO 9001 certified by the  TÜV Rheinland since May 2016